On the modelling of diffraction line profiles from nanocrystalline materials
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Solid State Phenomena
Abstract
Recent advances in Line Profile Analysis of powder diffraction patterns must be
paralleled by increasing attention to the quality and quantity of experimental data. The analysis of
simulated data with different noise levels demonstrates the importance of statistical quality to reveal
fine details of interest in the analysis of nanocrystalline materials, like the crystallite shape. It
also shows how synchrotron radiation diffraction can improve data quality concerning
laboratory measurements, both in terms of statistical quality and in terms of accessible information.
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Research Article