Purification of solar grade silicon using electromagnetic field
| dc.contributor.author | Dong, A. | |
| dc.contributor.author | Damoah, L.N.W. | |
| dc.contributor.author | Zhang, L. | |
| dc.contributor.author | Zhu, H. | |
| dc.date.accessioned | 2013-01-03T08:13:41Z | |
| dc.date.accessioned | 2017-10-14T06:40:34Z | |
| dc.date.available | 2013-01-03T08:13:41Z | |
| dc.date.available | 2017-10-14T06:40:34Z | |
| dc.date.issued | 2010 | |
| dc.description.abstract | Non-metallic particles and the metallic impurity elements in the solar cell silicon have a strong detrimental effect on the conversion efficiency of the solar cell. Removing these impurities is one of the important tasks for silicon refining. The current paper proposed a new approach to purify silicon - electromagnetic (EM) separation. Since the non-metallic particles and the metallic impurity elements are non- or less-conductive while the molten silicon is well conductive, under EM field, the Lorenz force will push the particles to the boundary layer, thus separate these inclusions. In the current study, a high frequency EM field was imposed on the silicon melt in laboratory scale experiments with a frequency of 60 kHz and 15.0 A current, the non-conductive SiC particles were successfully pushed to the boundary layer close to the crucible wall. | en_US |
| dc.identifier.citation | Anping Dong; Damoah, L.N.W.; Lifeng Zhang; Hui Zhu; "Purification of solar grade silicon using electromagnetic field”, in Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE, pp.002266-002269, doi: 10.1109/PVSC.2010.5617131 | en_US |
| dc.identifier.uri | http://197.255.68.203/handle/123456789/2306 | |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.subject | EM field | en_US |
| dc.subject | High frequency | en_US |
| dc.subject | Lorenz forces | en_US |
| dc.subject | Metallic impurity | en_US |
| dc.subject | Molten silicon | en_US |
| dc.title | Purification of solar grade silicon using electromagnetic field | en_US |
| dc.type | Article | en_US |
