High frequency electromagnetic purification of silicon
| dc.contributor.author | Damoah, L.N.W. | |
| dc.contributor.author | Zhang, L. | |
| dc.date.accessioned | 2013-01-03T07:58:33Z | |
| dc.date.accessioned | 2017-10-14T06:40:31Z | |
| dc.date.available | 2013-01-03T07:58:33Z | |
| dc.date.available | 2017-10-14T06:40:31Z | |
| dc.date.issued | 2012 | |
| dc.description.abstract | The use of electromagnetic field to remove suspended particles from metals such as aluminum by pushing to the boundary has been well studied. However, the potential of this method is yet to be exploited for the removal of inclusions from silicon. Considering the increasing amount of Top-cut SoG-Si scraps year upon year, mere is the need to harness all the potentials of technologies to recycle this materials to ensure sustainability. This study investigates, and discusses new results on the effect of processing parameters such as composition, coil current, and frequency on the removal of inclusions from silicon under high frequency AC electromagnetic field. | en_US |
| dc.identifier.citation | Damoah, L. N. W. and Zhang, L. (2012) High Frequency Electromagnetic Purification of Silicon, in EPD Congress 2012 (eds L. Zhang, J. A. Pomykala and A. Ciftja), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118359341.ch59 | en_US |
| dc.identifier.uri | http://197.255.68.203/handle/123456789/2300 | |
| dc.language.iso | en | en_US |
| dc.publisher | John Wiley & Sons, Inc. | en_US |
| dc.subject | Electromagnetic purification | en_US |
| dc.subject | Inclusions | en_US |
| dc.subject | Silicon | en_US |
| dc.title | High frequency electromagnetic purification of silicon | en_US |
| dc.type | Article | en_US |