Dodoo-Arhin, D.Vettori, G.D’Incau, M.Leoni, P.Scardi, P.2013-01-032017-10-142013-01-032017-10-142011Z. Kristallogr. Proc. 1 (2011) 75-80http://197.255.68.203/handle/123456789/2312X-ray diffraction line profile analysis based on the recently developed Whole Powder Pattern Modelling was used to investigate the microstructure changes in Cu2O powders milled in a vibrating cup mill. The reduction in the average size of coherently scattering domains - and simultaneous narrowing of the size distribution - occurs in the first minutes. An asymptotic limit of ca. 10 nm is obtained. The reduction in size is obtained at the expenses of introducing a massive quantity of dislocations in the system, reaching a limit of ca. 4×10-16 m-2. A proper nanocrystalline microstructure can be obtained for a milling of ca. 20 min.enDiffractionHigh Energy MillingWhole Powder Pattern ModellingArticle